Reduction of image acquisition time in scanning ion conductance microscopy using the “hopping”-mode

An adaptive algorithm has been developed and tested, aimed at reducing image acquisition time and improving the stability of scanning ion conductance microscopes operating in the “hopping” mode. The implementation of an analog feedback loop enhances overall performance. In experimental tests using the “hopping” mode, a stable image of the test object has been obtained with a four-fold reduction in scanning time.