P. S. Lemeshko, V. M. Kondratiev, E. A. Vyacheslavova, V. A. Moshnikov, “Multiphoton microscopy as a way to control the purification efficiency of silicon filamental nanocrystals”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 2025, Volume 51, Issue 6,Pages <nobr>12

Multiphoton microscopy as a way to control the purification efficiency of silicon filamental nanocrystals

P. S. Lemeshko^a, V. M. Kondratiev^bc, E. A. Vyacheslavova^c, V. A. Moshnikov^a

^a Saint Petersburg Electrotechnical University "LETI", St. Petersburg, Russia
^b Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region
^c Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg

Abstract: Multiphoton microscopy is a promising method for controlling the contamination degree and purification efficiency of solid-state structures and microstructures. The location and degree of contamination in the filamentous silicon nanocrystal structure, as well as the effectiveness of the structural cleaning procedure, are all determined by multiphoton microscopy investigation.

Keywords: two-photon microscopy, two-photon photoluminescence, filamentous nanoocrystals, silicon.

Received: 16.09.2024
Revised: 25.10.2024
Accepted: 12.11.2024

DOI: 10.61011/PJTF.2025.06.59924.20121