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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2014 Volume 40, Issue 2, Pages 10–15 (Mi pjtf8050)

This article is cited in 4 papers

Peculiarities of graphene layer formation from amorphous carbon and silicon-carbon films

E. A. Il'ichev, E. P. Kirilenko, G. N. Petrukhin, G. S. Rychkov, O. A. Sakharov, E. Z. Khamdolhov, E. S. Chernyavskaya, M. L. Shupegin, A. A. Shchekin

State Research Institute of Physical Problems

Abstract: Graphene layers on device structures have been formed from amorphous carbon and silicon-carbon films using a sequence of technological procedures, including thermodiffusion of carbon atoms, their accumulation at the heteroboundary between layers with significantly different diffusion coefficients, and subsequent phase transition from a carbon quasi-liquid to graphene layer.

Received: 04.07.2013


 English version:
Technical Physics Letters, 2014, 40:1, 52–54

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