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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2025 Volume 51, Issue 21, Pages 42–44 (Mi pjtf8416)

Features of the mesa-structure formation via electron-beam lithography in semiconductor GaAs-based compounds

A. E. Yachmenev, D. V. Garabov, R. R. Galiev, D. S. Ponomarev, D. V. Lavrukhin

National Research Centre "Kurchatov Institute", Moscow

Abstract: We study wet chemical etching of the low-temperature grown GaAs (LT-GaAs) using the resistive mask produced with electron-beam lithography. Efficient etching of the mesa-structure (i.e. mesa) is developed allowing to control exact parameters of the mesa in the given areas of LT-GaAs. The technology includes an essential retreatment of the LT-GaAs surface before applying the resist to improve adhesion, as well as treatment in oxygen plasma after its development. Applying the proposed technology, we fabricated large-area photoconductive THz emitter with sophisticated topology of the mesa-structure.

Keywords: optoelectronic source, terahertz radiation, wet chemical etching, mesa structure, semiconductors, electron-beam lithography.

Received: 19.05.2025
Revised: 15.07.2025
Accepted: 05.08.2025

DOI: 10.61011/PJTF.2025.21.61527.20377



© Steklov Math. Inst. of RAS, 2025