Abstract:
Superhard nanostructured multielement coatings based on (Ti–Hf–Zr–V–Nb)N composition have been studied before and after thermal annealing at 600$^\circ$C. It has been established that capture of positrons on defects takes place at the boundaries of nanograins and on interfaces (vacancies, nanopores, triple and higher-order joints of nanograins). Three-dimensional maps of the distribution of elements in super-hard coatings have been obtained using micro-proton-beam induced X-ray emission ($\mu$-PIXE) measurements. Analysis of the $\mu$-PIXE elemental profiles and defect profiles (obtained using a focused positron beam) helps understanding the physical picture of processes related to the formation of interfaces and sub-boundaries in nanostructured (Ti–Hf–Zr–V–Nb)N coatings.