Abstract:
It is established that semiconducting heterojunctions can be formed in the AgI–Ag$_2$HgI$_4$–HgI$_2$ and CuI–Cu$_2$HgI$_4$–HgI$_2$ systems obtained as a result of diffusion-controlled solid-state chemical reactions. Concentration profiles of diffusant ions in the obtained structures have been determined using the exciton spectroscopy and electron-probe microanalysis techniques. The current-voltage characteristics of heteroboundaries between ternary compounds and binary crystals have been measured in the dark and under illumination.