RUS  ENG
Full version
JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive

Pisma v Zhurnal Tekhnicheskoi Fiziki, 1986 Volume 12, Issue 1, Pages 32–36 (Mi pjtf9)

Layer-by-layer sample analysis in Mossbauer-spectroscopy with coverse electron registration by the proportional detector

A. A. Kiselev, R. N. Kuz'min, A. A. Novakova

Lomonosov Moscow State University

Received: 24.09.1985



Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024