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// Pisma v Zhurnal Tekhnicheskoi Fiziki
// Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki,
1986
Volume 12,
Issue 1,
Pages
32–36
(Mi pjtf9)
Layer-by-layer sample analysis in Mossbauer-spectroscopy with coverse electron registration by the proportional detector
A. A. Kiselev
,
R. N. Kuz'min
,
A. A. Novakova
Lomonosov Moscow State University
Received:
24.09.1985
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Steklov Math. Inst. of RAS
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