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JOURNALS // Prikladnaya Mekhanika i Tekhnicheskaya Fizika // Archive

Prikl. Mekh. Tekh. Fiz., 2012 Volume 53, Issue 2, Pages 115–127 (Mi pmtf1351)

This article is cited in 2 papers

Stress-strain state of an inclined elliptical defect in a plate under biaxial loading

A. A. Ostsemina, P. B. Utkinb

a South Ural Research and Production Center, Chelyabinsk, 454106, Russia
b South Ural State University, Chelyabinsk, 454080, Russia

Abstract: A mathematical model for the stress-strain state of a plate with an inclined elliptical defect under biaxial loading is considered. Exact formulas for stresses in polar coordinates, displacements, principal stresses, maximum shear stress, and stress intensity in the case of a plane stress state of the plate were obtained by the Kolosov–Muskhelishvili method. Simulation results are compared with experimental data obtained by holographic interferometry.

Keywords: linear fracture mechanics, inclined elliptical defect, Kolosov–Muskhelishvili method, biaxial loading, holographic interferometry.

UDC: 620.170.5.539.4

Received: 17.02.2011
Accepted: 01.09.2011


 English version:
Journal of Applied Mechanics and Technical Physics, 2012, 53:2, 246–257

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