RUS  ENG
Full version
JOURNALS // Prikladnaya Mekhanika i Tekhnicheskaya Fizika // Archive

Prikl. Mekh. Tekh. Fiz., 2017 Volume 58, Issue 3, Pages 198–209 (Mi pmtf716)

This article is cited in 9 papers

T-stress estimation by the two-parameter approach for a specimen with a V-shaped notch

O. Bouledrouaa, A. Elazziziab, M. Hadj Melianiac, G. Pluvinagec, Y. G. Matvienkod

a Hassiba Ben Bouali University of Chlef, Esalem City, 02000, Chlef, Algeria
b Mohamed Boudiaf University of Sciences and Technology Oran, Oran, 31000, Algeria
c Université Paul Verlaine de Metz, Metz, France
d Mechanical Engineering Research Institute of the Russian Academy of Sciences, Moscow, 101990, Russia

Abstract: In the present research, T-stress solutions are provided for a V-shaped notch in the case of surface defects in a pressurised pipeline. The V-shaped notch is analyzed with the use of the finite element method by the Castem2000 commercial software to determine the stress distribution ahead of the notch tip. The notch aspect ratio is varied. In contrast to a crack, it is found that the T-stress is not constant and depends on the distance from the notch tip. To estimate the T-stress in the case of a notch, a novel method is developed, inspired by the volumetric method approach proposed by Pluvinage. The method is based on averaging the T-stress over the effective distance ahead of the notch tip. The effective distance is determined by the point with the minimum stress gradient in the fracture process zone. This approach is successfully used to quantify the constraints of the notch-tip fields for various geometries and loading conditions. Moreover, the proposed T-stress estimation creates a basis for analyzing the crack path under mixed-mode loading from the viewpoint of the two-parameter fracture mechanics.

Keywords: constraint, T-stress, effective distance, notch, finite element analysis.

UDC: 539.375

Received: 15.12.2014
Revised: 16.09.2015

DOI: 10.15372/PMTF20170320


 English version:
Journal of Applied Mechanics and Technical Physics, 2017, 58:3, 546–555

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025