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// Prikladnaya Mekhanika i Tekhnicheskaya Fizika
// Archive
Prikl. Mekh. Tekh. Fiz.,
1966
Volume 7,
Issue 2,
Pages
87–88
(Mi pmtf8518)
Observation of stability loss of the surface layer of a bent crystal by reflection x-ray microscopy techniques
I. B. Staryi
,
A. A. Khanonkin
Odessa
Received:
30.09.1965
Fulltext:
PDF file (385 kB)
English version:
Journal of Applied Mechanics and Technical Physics, 1966,
7
:2,
57–58
©
Steklov Math. Inst. of RAS
, 2024