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JOURNALS // Problemy Upravleniya // Archive

Probl. Upr., 2006 Issue 5, Pages 52–57 (Mi pu374)

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Dynamic patterns recognition by an segmental type measuring system

Yu. N. Kulchin, A. Yu. Kim

Institute for Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences

Abstract: An architecture of a segmental-type distributed measuring system employing a neuron network for dynamic patterns recognition is offered. An algorithm for dynamic pattern model development with the help of Hankel matrices transformation is developed. An algorithm for images classification in a neuron network based on fuzzy sets theory is proposed.

UDC: 519.987



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