Total-internal-reflection holograms recorded in thin $As_2S_3$ films

A study was made of holograms recorded with a reference wave which experienced total internal reflection at the interface between the recording medium and air. The characteristics of the polarization dependence of the intensity of the reconstructed wave were investigated as a function of the polarization angle in the recording and reconstruction stages, and also as a function of the thickness of the recording medium ($As_2S_3$ film).