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Kvantovaya Elektronika, 1980 Volume 7, Number 11, Pages 2362–2366 (Mi qe10315)

Influence of changes in the waveguide thickness on the efficiency of Bragg diffraction of radiation by grating structures

Yu. A. Bykovskiĭ, V. L. Smirnov, V. N. Sorokovnikov

Moscow Engineering Physics Institute

Abstract: A study is made of the influence of the waveguide thickness on the Bragg diffraction efficiency and the possibility of utilizing this effect to develop highly sensitive detectors for small displacements and strain gauges is examined. It is shown that if the waveguide thickness deviates by 1.8 nm from its initial value of 1.1$\mu m$, this causes $10\%$ modulation of the radiation.

UDC: 621.373.826:621.396

PACS: 42.80.Lt, 07.10.+i

Received: 12.03.1980


 English version:
Soviet Journal of Quantum Electronics, 1980, 10:11, 1376–1378

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