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Kvantovaya Elektronika, 1980 Volume 7, Number 8, Pages 1778–1784 (Mi qe10547)

Investigation of prism-type thin-film electrooptic deflectors

S. I. Bozhevol'nyi, E. M. Zolotov, A. M. Prokhorov, V. A. Chernykh, E. A. Shcherbakov

P. N. Lebedev Physical Institute, the USSR Academy of Sciences, Moscow

Abstract: The characteristics of single-element and multielement prism deflectors were calculated for different electrode-structure parameters. Prism deflectors were prepared and investigated. An optical three-channel switch was made, based on a single-element deflector, which had a switching voltage per channel of $\thicksim2,5$ V and a crosstalk rejection factor of $\thicksim10$ dB.

UDC: 621.378.33

PACS: 42.80.Em

Received: 02.02.1980


 English version:
Soviet Journal of Quantum Electronics, 1980, 10:8, 1025–1028

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© Steklov Math. Inst. of RAS, 2024