Kvantovaya Elektronika, 1988 Volume 15, Number 11,Pages 2273–2275(Mi qe12633)
International conference on semiconductor injection lasers SELCO-87
Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures
Abstract:
It is shown that the yield of fault-free laser diodes is related to the density and distribution of dislocations in the substrate. A method is described for visualization of etch pits and of their relationship to defects in the substrate.