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Kvantovaya Elektronika, 1988 Volume 15, Number 11, Pages 2273–2275 (Mi qe12633)

International conference on semiconductor injection lasers SELCO-87

Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures

A. Baerwolff, P. Ènders, A. Knauer, D. Linke, U. Zeimer


Abstract: It is shown that the yield of fault-free laser diodes is related to the density and distribution of dislocations in the substrate. A method is described for visualization of etch pits and of their relationship to defects in the substrate.

UDC: 621.373.826.038.825.4

PACS: 42.55.Px, 73.40.Kp, 61.72.Lk


 English version:
Soviet Journal of Quantum Electronics, 1988, 18:11, 1422–1424

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© Steklov Math. Inst. of RAS, 2024