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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 2010 Volume 40, Number 7, Pages 589–595 (Mi qe14339)

This article is cited in 9 papers

Lasers

Catastrophic optical degradation of the output facet of high-power single-transverse-mode diode lasers. 2. Calculation of the spatial temperature distribution and threshold of the catastrophic optical degradation

D. R. Miftakhutdinov, A. P. Bogatov, A. E. Drakin

P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow

Abstract: The temperature distribution and the power threshold during the catastrophic optical degradation are calculated within the framework of the developed model of the COD of the output facet in high-power single-transverse-mode diode lasers. Comparison of the calculation results and the experiment show the model adequacy. The contribution of different physical mechanisms into the heating of the laser output facet is analysed. It is shown that the model under study can help to develop the method for predicting the laser lifetime by the accelerated ageing tests.

PACS: 42.55.Px, 42.60.Da, 42.60.Jf

Received: 26.04.2010


 English version:
Quantum Electronics, 2010, 40:7, 589–595

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© Steklov Math. Inst. of RAS, 2024