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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 2013 Volume 43, Number 3, Pages 237–241 (Mi qe15102)

This article is cited in 8 papers

Extreme light fields and their applications

Simulation of the generation of the characteristic X-ray emission by hot electrons in a foil

O. F. Kostenko, N. E. Andreev

Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow

Abstract: We have developed a model to calculate the yield of the characteristic X-ray radiation from a foil, taking into account the dependence of the average energy and the number of hot electrons on the intensity of the laser pulse, the self-absorption of X-rays and the effect of refluxing of hot electrons. The yield of Kα radiation from a silver foil is optimised at relativistic intensities. A method is proposed for diagnosing the effect of electron refluxing, which greatly increases the yield of Kα radiation.

Keywords: hot electrons, refluxing, generation and absorption of Kα radiation, foil.

PACS: 52.38.Ph, 52.25.Os, 52.59.Px, 52.50.Jm

Received: 24.12.2012
Revised: 12.02.2013


 English version:
Quantum Electronics, 2013, 43:3, 237–241

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© Steklov Math. Inst. of RAS, 2025