P. I. Khadzhi, D. V. Tkachenko, S. L. Gaivan, “Characteristic features of the steady-state transmission (reflection) by a thin semiconductor film in the exciton part of the spectrum”, Kvantovaya Elektronika, 1999, Volume 27, Number 3,Pages <nobr>265

This article is cited in 1 paper

Nonlinear optical phenomena

Characteristic features of the steady-state transmission (reflection) by a thin semiconductor film in the exciton part of the spectrum

P. I. Khadzhi^a, D. V. Tkachenko^b, S. L. Gaivan^c

^a Department of Physics and Mathematics, T. G. Shevchenko Pridnestrie State University, Tiraspol, Moldova
^b T.G. Shevchenko Dnester State University, Tiraspol, Moldova
^c Institute of Applied Physics Academy of Sciences of Moldova, Kishinev

Abstract: The steady-state transmission (reflection) of laser radiation by a thin semiconductor film was investigated taking into account the exciton — photon and elastic exciton — exciton interactions. Under certain conditions the resultant dependences of the transmission by a thin film on the amplitude of the incident radiation and on the detuning from a resonance exhibit a hysteresis, which can be explained by a shift of the exciton level when the exciton density is increased.

PACS: 42.65.Pc, 71.35.Gg, 78.20.Ci

Received: 22.03.1999