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Kvantovaya Elektronika, 2017 Volume 47, Number 1, Pages 54–57 (Mi qe16546)

This article is cited in 12 papers

X-ray optics

Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å

E. A. Vishnyakova, A. O. Kolesnikovab, A. A. Kuzinbc, D. V. Negrovb, E. N. Ragozinab, P. V. Sasorovd, A. N. Shatokhinab

a P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
b Moscow Institute of Physics and Technology (State University), Dolgoprudny, Moscow region
c Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow
d Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow

Abstract: A broadband stigmatic (imaging) soft X-ray (λ > 120 Å) spectrometer is experimentally realised. The optical configuration of the spectrometer comprises a plane grazing-incidence reflection grating with a spacing varying across its aperture according to a preassigned law [a so-called varied line-space (VLS) grating] and a broadband spherical normal-incidence mirror with an aperiodic Mo/Si multilayer structure. The average plate scale amounts to ~5.5 Å mm-1. The radiation is recorded with a matrix CCD detector (2048 × 1024 pixels of size 13 μm). The line spectra of the multiply charged ions LiIII and FV–FVII excited in laser-produced plasma are recorded with a spatial resolution of ~26 μm and a spectral resolving power R ≈ 500 is experimentally demonstrated.

Keywords: soft X-ray range, stigmatic (imaging) spectrometer, VLS grating, aperiodic multilayer mirror, laser-produced plasma.

Received: 28.11.2016


 English version:
Quantum Electronics, 2017, 47:1, 54–57

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