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Kvantovaya Elektronika, 2019 Volume 49, Number 8, Pages 779–783 (Mi qe17102)

This article is cited in 5 papers

X-ray spectrometer

Scanning spectrometer/monochromator for a wavelength range of 50–330 Å

A. N. Shatokhinab, E. A. Vishnyakova, A. O. Kolesnikovab, E. N. Ragozina

a P. N. Lebedev Physical Institute of the Russian Academy of Sciences, Moscow
b Moscow Institute of Physics and Technology (State University), Dolgoprudny, Moscow region

Abstract: A flat-field scanning spectrometer/monochromator of the Hettrick–Underwood type is implemented for a wavelength range λ ≈ 50–330 Å. The optical arrangement of the spectrograph comprises a focusing spherical (R = 6000 mm) mirror, mounted at a grazing angle of 8.34°, and a grazing-incidence plane varied linespace (VLS) grating operating for a constant deflection angle of 16.68°. The entrance and output slits of the instrument are immobile, and the focal distance varies only slightly over its operating spectral range. The short-wavelength boundary of the operating range is determined by the spectral source brightness and the reflection coefficients of the grating and the mirror rather than by defocusing. Laser-produced plasma spectra excited by a focused laser beam (0.5 J, 8 ns, 1.06 μm) are recorded. A spectral resolving power λ/δλ = 1300 is demonstrated at a wavelength of 182Å. The configuration of the instrument of this type is suited to soft X-ray reflectometry and metrology with the use of laser-plasma and synchrotron radiation sources, and is perfectly compatible with modern CCD detectors.

Keywords: soft X-ray radiation, scanning spectrometer, focusing mirror, VLS grating, laser-produced plasma.

Received: 19.03.2019
Revised: 15.05.2019


 English version:
Quantum Electronics, 2019, 49:8, 779–783

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© Steklov Math. Inst. of RAS, 2024