Abstract:
This paper investigates the dynamics of amplified spontaneous x-ray emission escaping from a randomly inhomogeneous plasma active medium through its ends and lateral surface. It is shown that the scattering of radiation by fluctuations in the dielectric permittivity, $\tilde\varepsilon$, can be utilized to extract energy through the lateral surface of the active medium. The radiant intensity is maximal in an off-axis direction in this case. When both regular refraction and scattering by $\tilde\varepsilon$ are operating, the distributed extraction of the light is determined by that effect which has the smaller characteristic length (i.e., the scattering length or the refraction length).