V. V. Balanyuk, V. F. Krasnov, S. L. Musher, V. I. Prots', V. E. Ryabchenko, S. A. Stoyanov, S. G. Struts, M. F. Stupak, V. S. Syskin, “Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods”, Kvantovaya Elektronika, 1995, Volume 22, Number 2,Pages <nobr>196

This article is cited in 4 papers

Laser applications and other topics in quantum electronics

Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods

V. V. Balanyuk^a, V. F. Krasnov^a, S. L. Musher^a, V. I. Prots'^a, V. E. Ryabchenko^a, S. A. Stoyanov^b, S. G. Struts^a, M. F. Stupak^a, V. S. Syskin^a

^a Institute of Automation and Electrometry, Siberian Branch of Russian Academy of Sciences, Novosibirsk
^b Department of Chemistry, Novosibirsk State University, Novosibirsk, Russian Federation

Abstract: The local crystal quality of epitaxial CdTe films was investigated in the transmission geometry by generation of the second harmonic of a YAP : Nd laser. A computer controlled laser unit was constructed specifically for fast local diagnostics of the crystal quality of epitaxial films.

PACS: 78.66.Fd, 42.65.Ky, 07.60.-j

Received: 31.12.1995