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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1992 Volume 19, Number 2, Pages 114–127 (Mi qe3351)

This article is cited in 4 papers

Review

Projection x-ray lithography implemented using point sources

I. A. Artyukov, L. L. Balakireva, F. Bijkerk, A. V. Vinogradov, N. N. Zorev, I. V. Kozhevnikov, V. V. Kondratenko, O. F. Ogurtsov, A. G. Ponomarenko, A. I. Fedorenko


Abstract: An analysis is made of the state of the art of x-ray lithography and x-ray optics. The principles of design and configurations of projection x-ray lithographic systems are considered. An analysis is made of the main trends of research on these topics proceeding in the laboratories in the Soviet Union, USA, Japan, and Great Britain. The problems encountered in the development of multilayer normal-incidence x-ray mirrors are described.

UDC: 778.33:776

PACS: 41.50.+h, 42.82.Cr, 42.79.Bh

Received: 20.06.1991


 English version:
Soviet Journal of Quantum Electronics, 1992, 22:2, 99–110

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© Steklov Math. Inst. of RAS, 2024