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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1972 Number 3(9), Pages 105–106 (Mi qe4446)

Brief Communications

Empirical estimation of the service life of injection lasers from short-term tests

P. G. Eliseev, I. Z. Pinsker, Yu. F. Fedorov


Abstract: It is shown that an effective method for selecting long-life injection lasers can be based on the initial rate of rise of the threshold current. This gives better results than the selection in accordance with the initial parameters. The aging mechanism is assumed to consist of the formation of new nonradiative recombination centers in the process of recombination of excess carriers.

UDC: 621.378.35

PACS: 42.55.Px, 42.60.Lh, 42.60.Jf

Received: 18.11.1971


 English version:
Soviet Journal of Quantum Electronics, 1972, 2:3, 290–291


© Steklov Math. Inst. of RAS, 2024