RUS  ENG
Full version
JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1984 Volume 11, Number 3, Pages 537–543 (Mi qe4903)

This article is cited in 11 papers

Characteristics of two-layer phase holograms

B. Ya. Zel'dovich, D. I. Mirovitskiĭ, N. V. Rostovtseva, O. B. Serov


Abstract: Theoretical and experimental investigations were made of thin two-layer phase holograms. It was found that their properties were intermediate between thin and volume holograms. The diffraction efficiency of such two-layer holograms was considerably higher than the theoretical limit for a thin phase hologram and could reach 67%. Moreover, they were found to have a high angular selectivity, which differs qualitatively from the selectivity of volume holograms. The characteristics of two-layer holograms were studied as a function of the angle between the recording waves and as a function of the exposure. A good agreement was observed between the experimental and theoretical data.

UDC: 778.38

PACS: 42.40.Pa, 42.40.Lx

Received: 21.04.1983


 English version:
Soviet Journal of Quantum Electronics, 1984, 14:3, 364–369

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024