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Kvantovaya Elektronika, 1984 Volume 11, Number 4, Pages 661–665 (Mi qe4998)

This article is cited in 1 paper

Resolving power of laser lithography on thin metal films

V. P. Veiko, E. A. Tuchkova, E. B. Yakovlev


Abstract: A theoretical analysis is made of the resolving power of laser thermolithography under destructive and nondestructive interaction conditions. It is shown that the maximum resolving power of laser lithography in the case of nondestructive interaction corresponds to the resolving power of the optical system employed, whereas in the case of destructive interaction it is governed by the properties of film and substrate materials, by the film thickness, and by the irradiation regime. The conditions ensuring maximal resolving power of laser thermolithography are determined.

UDC: 776:621.373.826

PACS: 42.62.-b, 42.30.Va, 42.60.Jf, 61.80.Ba, 61.82.Bg

Received: 22.02.1983


 English version:
Soviet Journal of Quantum Electronics, 1984, 14:4, 449–452

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© Steklov Math. Inst. of RAS, 2024