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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1994 Volume 21, Number 1, Pages 78–80 (Mi qe6)

This article is cited in 2 papers

Laser applications and other topics in quantum electronics

Surface roughness meter for the range 1–25 nm based on the scattered-light indicatrix

S. A. Abrosimov, M. V. Vysogorets, A. A. Malyutin, A. V. Nenashev, R. V. Serov

General Physics Institute, Russian Academy of Sciences, Moscow

Abstract: A description is given of an instrument for measuring the surface roughness, based on determination of the scattering indicatrix of laser radiation and characterised by a dynamic range corresponding to the intensity ratio 106. The capabilities of this instrument were demonstrated by measurements on special roughness test objects, diamond-turned mirrors, and high-quality polished metal surfaces.

UDC: 535.36

PACS: 68.35.Dv

Received: 09.04.1993


 English version:
Quantum Electronics, 1994, 24:1, 75–77

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