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Kvantovaya Elektronika, 1982 Volume 9, Number 11, Pages 2140–2150 (Mi qe6081)

Analysis of factors influencing the threshold current of Pb1–xSnxSe injection heterolasers

L. P. Bychkova, O. I. Davarashvili, P. G. Eliseev, M. I. Saginuri, R. I. Chikovani, A. P. Shotov


Abstract: An analysis is made of the factors which influence the threshold current in PbSe/Pb1–xSnxSe injection heterolasers. These factors include the waveguide structure, electron confinement, inhomogeneity of the distribution of the gain across the thickness, nonradiative recombination at the heterojunctions and in the bulk, and temperature. The conditions are identified under which anomalies can be expected in the temperature dependence of the threshold current because of the influence of free carriers on the refractive index. The results agree with the experimental values of the threshold current density for a surface recombination velocity of ~2×105 cm/sec and an internal quantum efficiency of ≤ 0.1.

UDC: 621.373.826.038.825.4

PACS: 42.55.Px

Received: 06.09.1981
Revised: 16.11.1981


 English version:
Soviet Journal of Quantum Electronics, 1982, 12:11, 1391–1397

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