Abstract:
Textured films exhibiting an anisotropic thermoelectric power were formed by oblique deposition of Bi and Bi–Sb evaporated from a crucible on glass and single-crystal silicon substrates. The main parameters of infrared radiation detectors utilizing these films were determined. It was found that the detectors made of Bi and Bi–Sb films (of ~0.2 μ thickness) deposited on silicon substrates reproduced the time structure of CO2 laser radiation with a response time of ~10 nsec, had a conversion factor of at least 20 μ V/W, a resistance of 50–100 Ω, and a zone inhomogeneity of less than 10%. The detectors were insensitive to the polarization of the radiation.