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JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1985 Volume 12, Number 8, Pages 1755–1757 (Mi qe7630)

Brief Communications

Angular dependence of the damage threshold of thin metal films

S. V. Kondrashov, N. F. Pilipetskiĭ, S. Yu. Savanin, V. V. Shkunov


Abstract: An experimental investigation was made of the angular dependence of the laser damage threshold of thin metal films. It was found that in the case of the p polarization of the incident radiation there was a considerable reduction in the damage threshold of silver, copper, and aluminum films when the angles of incidence corresponded to efficient excitation of surface polaritons.

UDC: 621.337.826

PACS: 61.80.Ba, 71.36.+c, 73.20.Mf, 79.20.Ds

Received: 05.11.1984


 English version:
Soviet Journal of Quantum Electronics, 1985, 15:8, 1162–1163

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© Steklov Math. Inst. of RAS, 2024