Abstract:
An investigation was made of the optical properties of vanadium oxide films which might be used for repeated recording of optical data. The dependences of the diffraction efficiency on the degree of oxidation and thickness of a vanadium film were determined. The nature of holograms recorded in vanadium oxide films was analyzed and optimization of the characteristics of these films was found to be possible. A diffraction efficiency of 1.4% was obtained at λ = 0.63 μ. By way of illustration, vanadium oxide films were used in holographic interferometry in the infrared range.