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JOURNALS // Uspekhi Khimii // Archive

Usp. Khim., 1990 Volume 59, Issue 7, Pages 1052–1084 (Mi rcr825)

This article is cited in 8 papers

Low-temperature X-ray diffraction analysis: possibilities in the solution of chemical problems

M. Yu. Antipin

A. N. Nesmeyanov Institute of Organoelement Compounds, USSR Academy of Sciences, Moscow

Abstract: The possibilities of the modern precision X-ray diffraction method for the determination of the exact geometry, the characteristics of the thermal vibrations, and the distribution of electron density in the crystals of molecular compounds are examined in relation to a number of examples. The role of such investigations in the solution of chemical problems is demonstrated. The bibliography includes 134 references.

UDC: 548.737

DOI: 10.1070/RC1990v059n07ABEH003572


 English version:
Russian Chemical Reviews, 1990, 59:7, 607–626

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