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JOURNALS
// Sibirskii Zhurnal Industrial'noi Matematiki
// Archive
Sib. Zh. Ind. Mat.,
2000
Volume 3,
Number 1,
Pages
110–115
(Mi sjim89)
Local tomographical reconstruction of a thin defect envelope by using a standard pattern
S. M. Zerkal'
UDC:
514.8
+620.179.15
Received:
04.04.2000
Fulltext:
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Bibliographic databases:
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Steklov Math. Inst. of RAS
, 2024
Fulltext:
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