RUS  ENG
Full version
JOURNALS // Trudy Matematicheskogo Instituta imeni V.A. Steklova // Archive

Trudy Mat. Inst. Steklova, 2018 Volume 301, Pages 219–224 (Mi tm3905)

This article is cited in 4 papers

Complete diagnostic length $2$ tests for logic networks under inverse faults of logic gates

K. A. Popkov

Keldysh Institute of Applied Mathematics, Russian Academy of Sciences, Miusskaya pl. 4, Moscow, 125047 Russia

Abstract: It is proved that any Boolean function can be implemented by a logic network in the basis $\{x\,\&\,y\,\&\,z,x\oplus y,1\}$ in such a way that this logic network admits a complete diagnostic test of length at most $2$ with respect to inverse faults at the outputs of logic gates.

UDC: 519.718.7

Received: October 9, 2017

DOI: 10.1134/S0371968518020164


 English version:
Proceedings of the Steklov Institute of Mathematics, 2018, 301, 207–212

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025