RUS  ENG
Full version
JOURNALS // Teplofizika vysokikh temperatur // Archive

TVT, 2008 Volume 46, Issue 5, Pages 709–716 (Mi tvt1136)

This article is cited in 21 papers

Heat and Mass Transfer and Physical Gasdynamics

Integrated measurement of the wave characteristics of heated film of liquid by the capacitance and fluorescence methods

E. A. Chinnov, S. M. Kharlamov, A. D. Nazarov, E. Sokolov, D. M. Markovich, A. Ph. Serov, O. A. Kabov

S.S. Kutateladze Institute of Thermophysics, Siberian Division of the Russian Academy of Sciences

Abstract: Measuring the wave characteristics of a film of liquid by different methods enables one to improve the reliability of data and obtain new information about the process being studied. Along with the data obtained using the capacitance method already employed for the investigation of the field and dynamics of thickness of a nonisothermal film of liquid, results of measurement by the fluorescence method are given in this paper. The quantitative characteristics of nonisothermal film flow, obtained for the first time using the fluorescence method, are compared with the data obtained using an eight-channel capacitive thickness gage. The capabilities of each method are analyzed from the standpoint of measuring the characteristics of nonisothermal film of liquid in the heater region. It is experimentally demonstrated that the data obtained by the capacitance and fluorescence methods agree well with each other. This enables one to assume that both methods of measurement produce results which adequately accurately describe the real wave pattern of flow of nonisothermal film of liquid. The error of measurement of the thickness of nonisothermal film of liquid by the fluorescence and capacitance methods is at least $3$ $\%$. The spatial resolution of the capacitance method is $0.5$$1$ mm, and that of the fluorescence method – $0.1$ mm.

UDC: 536.423.4

PACS: 47.15 gm; 47.80.– v

Received: 03.04.2007


 English version:
High Temperature, 2008, 46:5, 647–653

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024