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JOURNALS
// Uspekhi Fizicheskikh Nauk
// Archive
UFN,
1964
Volume 82,
Number 2,
Pages
325–386
(Mi ufn11907)
This article is cited in
32
papers
REVIEWS OF TOPICAL PROBLEMS
Herstellung und eigenschaften reiner halbleiteroberflächen
G. Håiland
UDC:
537.311.33
DOI:
10.3367/UFNr.0082.196402f.0325
Fulltext:
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Cited by
English version:
Physics–Uspekhi, 1961,
9
:8,
393–454
©
Steklov Math. Inst. of RAS
, 2024
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