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JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 1989 Volume 158, Number 4, Pages 679–721 (Mi ufn7686)

This article is cited in 60 papers

NEW INSTRUMENTS AND RESEARCH METHODS

Polarization phenomena in x-ray optics

V. A. Belyakov, V. E. Dmitrienko

Scientific and Research Centre on Surface and Vacuum Properties Investigations, Moscow

Abstract: This review is devoted to polarization phenomena observed in the x-ray range. It is noted that x-ray polarization effects are due to two physical factors, namely, the diffraction of x-rays and the anisotropy of the x-ray susceptibility of atoms in crystals. Diffraction-induced birefringence, dichroism, and change in polarization state are very dependent on the degree of imperfection of the crystal. Effects associated with the anisotropy of x-ray susceptibility, which have not been adequately investigated so far, are discussed in some detail. The anisotropy can lead to a qualitatively new effect, namely, the appearance of additional reflections with unusual polarization properties that provide information about crystal structure and chemical bonding. Magnetic scattering of synchrotron x-rays has become a powerful tool for the investigation of magnetic ordering in crystals. Practical applications discussed in this review include different modern x-ray polarizers, analyzers, and quarter-wave plates for obtaining and analyzing circular polarizations.

UDC: 548.734

PACS: 41.50.+h, 07.85.-m, 42.79.Ci

DOI: 10.3367/UFNr.0158.198908e.0679


 English version:
Physics–Uspekhi, 1989, 32:8, 697–719


© Steklov Math. Inst. of RAS, 2024