RUS  ENG
Full version
JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 1975 Volume 116, Number 2, Pages 303–314 (Mi ufn9999)

This article is cited in 6 papers

NEW INSTRUMENTS AND METHODS OF MEASUREMENT

Use of high-voltage electron microscopy in solid-state physics

G. G. Bondarenko, L. N. Bystrov, L. I. Ivanov, Yu. M. Platov

Baikov Institute of Metallurgy USSR Academy of Sciences, Moscow

Abstract: An analysis is made of the use of high-voltage electron microscopes in solid-state physics research. The most promising fields of application of high-voltage electron microscopes are discussed; these involve mainly research on the mechanism of the action of radiation on solids.

UDC: 537.533.35.07:539.2

PACS: 07.80., 61.16.D, 61.80.F

DOI: 10.3367/UFNr.0116.197506d.0303


 English version:
Physics–Uspekhi, 1975, 18:6, 446–451


© Steklov Math. Inst. of RAS, 2025