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JOURNALS // Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika // Archive

Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015 Number 1, Pages 55–59 (Mi vmumm209)

This article is cited in 2 papers

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Complete tests relative to displacing faults of inputs of circuits

E. V. Morozov

Lomonosov Moscow State University, Faculty of Computational Mathematics and Cybernetics

Abstract: The paper is focused on faults of circuit inputs such that the output value of fault circuits depends only on correct inputs. It is shown that the Shannon function of the length of the detecting test for such faults is equal to $2n-\log_2{n}+O(\log_2{\log_2{n}})$ and the Shannon function of the length of the diagnostic test is asymptotically equal to $2^n$.

Key words: Boolean function, Shannon function, tests.

UDC: 519.718

Received: 12.12.2013


 English version:
Moscow University Mathematics Bulletin, Moscow University Måchanics Bulletin, 2015, 70:1, 37–40

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