Abstract:
In this article, we study a model of the drift-diffusion transport of charge carries in the layers of certain fractal structure. We take into account the process of recombination of charge carries. Solutions of model equations are found in the closed form.
Keywords:volume charge density, charge carrier recombination, drift-diffusion transport of charge carriers, Riemann–Liouville fractional derivative, Caputo fractional derivative, fractal structure.
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