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JOURNALS // Vestnik Sankt-Peterburgskogo Universiteta. Seriya 10. Prikladnaya Matematika. Informatika. Protsessy Upravleniya // Archive

Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 2017 Volume 13, Issue 1, Pages 17–26 (Mi vspui317)

This article is cited in 1 paper

Applied mathematics

Method for determining optical constants and the thickness of the thin film

A. G. Karpov, V. A. Klemeshev

St. Petersburg State University, 7–9, Universitetskaya nab., St. Petersburg, 199034, Russian Federation

Abstract: Here are presented the results of the development and application of methods for determining the optical constants and thickness of thin films. The generalized target model function is formed to determine the unmeasured parameters. The model is applied by using the least squares method and the steepest descent. Increased efficiency is achieved by using a three-step processing algorithm. The proposed method was applied to calculate the characteristics of the multi-alkali photocathode, which is a complex compound having in its composition antimonides of potassium, sodium and cesium. A comparison of the calculation results with the data given in the literature is presented. Refs 11. Figs 4.

Keywords: thin film, optical constants, the thickness of the thin film, the generalized target model function, the data processing algorithm.

UDC: 004.942, 538.958

Received: November 3, 2016
Accepted: January 19, 2017

Language: English

DOI: 10.21638/11701/spbu10.2017.102



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