S. V. Bukharin, A. V. Melnikov, V. V. Menshih, “Method for expanding the object base of examination by stitching solutions of hierarchy analysis method”, Vestnik YuUrGU. Ser. Mat. Model. Progr., 2017, Volume 10, Issue 2,Pages <nobr>74

This article is cited in 1 paper

Programming & Computer Software

Method for expanding the object base of examination by stitching solutions of hierarchy analysis method

S. V. Bukharin^a, A. V. Melnikov^b, V. V. Menshih^b

^a Voronezh State University of Engineering Technologies, Voronezh, Russian Federation
^b Voronezh Institute of the Ministry of Internal Affairs of Russia, Voronezh, Russian Federation

Abstract: The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21–24, that is enough for the most practical cases of examination.

Keywords: hierarchy analysis method; optoelectronic detectors; quality index.

UDC: 519.816

MSC: 03D55

Received: 25.01.2017

Language: English

DOI: 10.14529/mmp170206