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JOURNALS // Zapiski Nauchnykh Seminarov POMI // Archive

Zap. Nauchn. Sem. LOMI, 1985 Volume 142, Pages 119–123 (Mi znsl4323)

Hodges–Lehmann asymptotic efficiency of the Kolmogorov and Smirnov goodness-of-fit tests

Ya. Yu. Nikitin


Abstract: One considers the Hodges–Lehmann asymptotic efficiency of the Kolmogorov and Smirnov goodness-of-fit tests, which measures the rate of the exponential decrease of the errors of the second kind, under a fixed significance level. It is shown that the Kolmogorov test is always asymptotically optimal in this sense, while the one-sided Smirnov test is asymptotically optimal under additional conditions imposed on the parametric family of distributions.

UDC: 519.2


 English version:
Journal of Soviet Mathematics, 1987, 36:4, 517–520

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