Abstract:
The problem of multiple upper outliers detection in samples from location-scale and shape-scale families is considered. A new test statistic is proposed. The critical values of the new test statistic are tabulated by simulation. The power of the new test and other available tests are compared by simulation.
Key words and phrases:location-scale family, non-spurious power, outliers, power comparison, shape-scale family, slippage alternative, Weibull and extreme-value distributions.