This publication is cited in the following articles:
E. V. Kuzmin, O. E. Gorbunov, P. O. Plotnikov, V. A. Tyukin, V. A. Bashkin, “Assessing Flaw Severity on Interpretation of Eddy-Current Defectograms”, Aut. Control Comp. Sci., 56:7 (2022), 723
E. V. Kuzmin, O. E. Gorbunov, P. O. Plotnikov, V. A. Tyukin, V. A. Bashkin, “Otsenka stepeni opasnosti defektov pri rasshifrovke vikhretokovykh defektogramm”, Model. i analiz inform. sistem, 28:2 (2021), 170–185