RUS  ENG
Полная версия
ЖУРНАЛЫ // Журнал Сибирского федерального университета. Серия «Математика и физика»

Журн. СФУ. Сер. Матем. и физ., 2024, том 17, выпуск 2, страницы 246–256 (Mi jsfu1154)

Analysis of the electric current distribution in a three-layer conductive structure
Alexey A. Levitskiy, Pavel S. Marinushkin, Valentina A. Bakhtina

Список литературы

1. H.Murrmann, D.Widmann, “Current Crowding on Metal Contacts to Planar Devices”, IEEE Transactions on Electron Devices, 16:12 (1969), 1022–1024  crossref
2. H.H.Berger, “Models for Contacts to Planar Devices”, Solid-State Electronics, 15 (1972), 145–158  crossref
3. D.B.Scott, W.R.Hunter, H.Shichijo, “A Transmission Line Model for Silicided Diffusions: Impact on the Performance of VLSI Circuits”, IEEE Transactions on Electron Devices, ED-29:4 (1982), 651–661  crossref
4. G.Reeves, B.Harrison, “Determination of Contact Parameters of Interconnecting Layers in VLSI Circuits”, IEEE Transactions on Electron Devices, ED-33:3 (1986), 328–334  crossref
5. G.K.Reeves, P.W.Leech, H.B.Harrison, “A new Electrical Model for Calculation the Sheet Resistance Parameter in Alloyed Ohmic Contacts”, MRS Mat. Res. Symp. Proc., 337 (1994), 275–280  crossref
6. G.K.Reeves, P W.Leech, H.B.Harrison, “Understanding the Sheet Resistance Parameter of Alloyed Ohmic Contacts Using a Transmission Line Model”, Solid-State Electronics, 38:4 (1995), 745–751  crossref
7. G.K.Reeves, H.B.Harrison, “An Analytical Model for Alloyed Ohmic Contacts Using a Trilayer Transmission Line Mode”, IEEE Transactions on Electron Devices, 42:8 (1995), 1536–1547  crossref
8. G.K.Reeves, H.B.Harrison, P.W.Leech, “Modeling Geometrical Effects of Parasitic and Contact Resistance of FET Devices”, MRS Mat. Res. Symp. Proc., 427 (1996), 147–152  crossref
9. G.K.Reeves, H.B.Harrison, “Using TLM Principles to Determine MOSFET Contact and Parasitic Resistance”, Solid-State Electronics, 41:8 (1997), 1067–1074  crossref
10. N.Shrestha, G.K.Reeves, P.W.Leech, Y.Pan, A.S.Holland, “Analytical test structure model for determining lateral effects of tri-layer ohmic contact beyond the contact edge”, Facta Universitatis, Series: Electronics and Energetics, 30:2 (2017), 257–265  crossref  mathscinet
11. N.Sha, L.P.J.Kenney, B.Heller, M.Moatamedi, “A Finite Element Model to Identify Electrode Influence on Current Distribution in the Skin”, Artificial Organs, 32:8 (2008), 639–643  crossref
12. T.Keller, A.Kuhn, “Electrodes for transcutaneous (surface) electrical stimulation”, Journal of Automatic Control, University of Belgrade, 18:2 (2008), 35–45  crossref
13. T.Keller, A.Kuhn, “Skin properties and the influence on electrode design for transcutaneous (surface) electrical stimulation”, Chapter in IFMBE proceedings, 25:9 (2010), 492–495  crossref
14. M.Prodanovic, J.Malesevic, M.Filipovic, T.Jevtic, G.Bijelic, N.Malesevic, “Numerical Simulation of the Energy Distribution in Biological Tissues During Electrical Stimulation”, Serbian Journal of Electrical Engineering, 10:1 (2013), 165–173  crossref


© МИАН, 2025