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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

2018, Volume 52, Issue 3


Electronic properties of semiconductors
Electrical breakdown in pure $n$- and $p$-Si
V. F. Bannaya, E. V. Nikitina
291
Isoelectronic oxygen centers and conductivity of CdS crystals compared with PbS crystals
N. K. Morozova, B. N. Miroshnikov
295
Electronic structure of four-element clathrates of the Ba–Zn–Si–Ge system
N. A. Borshch, S. I. Kurganskii
299
Optical transitions in ZnSe and CdTe crystals with involvement of the cation $d$ bands
V. V. Sobolev, D. A. Perevoshchikov
304
Mechanism of the generation of donor–acceptor pairs in heavily doped $n$-ZrNiSn with the Ga acceptor impurity
V. A. Romaka, P. -F. Rogl, D. Frushart, D. Kaczorowski
311
Deep radiation-induced defect centers created by a fast neutron flux in CdZnTe single crystals
S. V. Plyatsko, L. V. Rashkovetskyi
322
Formation of radiation defects by proton braking in lightly doped $n$- and $p$-SiC layers
V. V. Kozlovsky, A. È. Vasil'ev, P. A. Karaseov, A. A. Lebedev
327

Surface, interfaces, thin films
Surface nanostructures forming during the early stages of the metal-assisted chemical etching of silicon. Optical properties of silver nanoparticles
Yu. A. Zharova, V. A. Tolmachev, A. I. Bednaya, S. I. Pavlov
333
Influence of the thermal conditions of fabrication and treatment on the optical properties of In$_{2}$O$_{3}$ films
A. A. Tikhii, Yu. M. Nikolaenko, Yu. I. Zhikhareva, A. S. Korneevets, I. V. Zhikharev
337

Micro- and nanocrystalline, porous, composite semiconductors
Specific features of the optical characteristics of porous silicon and their modification by chemical treatment of the surface
A. S. Len'shin
342
Effect of low $\gamma$-radiation doses on the optical properties of porous silicon
D. I. Bilenko, O. Ya. Belobrovaya, D. V. Terin, V. V. Galushka, I. V. Galushka, A. E. Zharkova, V. P. Polyanskaya, V. I. Sidorov, I. T. Yagudin
349

Carbon systems
Electron–electron and electron–phonon interactions in graphene on a semiconductor substrate: simple estimations
S. Yu. Davydov
353

Semiconductor physics
Optimal doping of diode current interrupters
A. S. Kyuregyan
359
Schottky-barrier model nonlinear in surface-state concentration and calculation of the I–V characteristics of diodes based on SiC and its solid solutions in the composite charge-transport model
V. I. Altukhov, A. V. Sankin, A. S. Sigov, D. K. Sysoev, È. G. Yanukyan, S. V. Filippova
366
Field-effect transistor based on the proton conductivity of graphene oxide and nafion films
V. A. Smirnov, A. D. Mokrushin, N. N. Denisov, Yu. A. Dobrovolsky
370
Mechanism and behavior of the light flux decrease in light-emitting diodes based on AlGaN/InGaN/GaN structures with quantum wells upon prolonged direct-current flow of various densities
F. I. Manyakhin
378
Modification of photovoltaic laser-power ($\lambda$ = 808 nm) converters grown by LPE
V. P. Khvostikov, S. V. Sorokina, N. S. Potapovich, O. A. Khvostikova, N. Kh. Timoshina, M. Z. Shvarts
385
Influence of heat dissipation conditions on the characteristics of concentrator photoelectric modules
A. V. Andreeva, N. Yu. Daviduk, D. A. Malevskii, A. N. Panchak, N. A. Sadchikov, A. V. Chekalin
390

Manufacturing, processing, testing of materials and structures
Photoluminescence studies of Si-doped epitaxial GaAs films grown on (100)- and (111)A-oriented GaAs substrates at lowered temperatures
G. B. Galiev, E. A. Klimov, A. N. Klochkov, S. S. Pushkarev, P. P. Maltsev
395
Formation of Cu$_{2}$O and ZnO crystal layers by magnetron assisted sputtering and their optical characterization
V. F. Agekyan, E. V. Borisov, A. S. Gudovskikh, D. A. Kudriashov, A. O. Monastyrenko, A. Yu. Serov, N. G. Filosofov
402
Formation of a stepped Si(100) surface and its effect on the growth of Ge islands
M. Yu. Yesin, A. I. Nikiforov, V. A. Timofeev, A. R. Tuktamyshev, V. I. Mashanov, I. D. Loshkarev, A. S. Deryabin, O. P. Pchelyakov
409
Formation of macropores in $n$-Si upon anodization in an organic electrolyte
E. V. Astrova, N. E. Preobrazhenskii, G. V. Li, S. I. Pavlov
414


© Steklov Math. Inst. of RAS, 2026