Mudrov E V

Publications in Math-Net.Ru

1. Measuring the temperature of a silicon chip in a plasmochemical reactor by laser interferometry
   
   TVT, 30:2 (1992),  372–378
2. Measurement of monocrystal temperature in the $300$–$700$ K range on the basis of infrared radiation absorption
   
   TVT, 29:1 (1991),  182–184