Azaryan M. H.

Publications in Math-Net.Ru

1. Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method
   
   Proceedings of the YSU, Physical and Mathematical Sciences, 2010, no. 3,  63–67
2. Noise in Symmetric Planar Structures of Silicon Compensated with Zinc
   
   Fizika i Tekhnika Poluprovodnikov, 18:7 (1984),  1173–1177