Sorokin Lev Mikhailovich

Publications in Math-Net.Ru

1. Structural characterization of a short-period superlattice based on the CdF$_{2}$/CaF$_{2}$/Si(111) heterostructure by transmission electron microscopy and X-ray diffractometry
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021),  3–6
2. Study of dentin structural features by computed microtomography and transmission electron microscopy
   
   Zhurnal Tekhnicheskoi Fiziki, 90:9 (2020),  1449–1461
3. A TEM study of AlN–AlGaN–GaN multilayer buffer structures on silicon substrates
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020),  50–54
4. An increase of threading dislocations filtering efficiency in AlN/$c$-Al$_{2}$O$_{3}$ templates with faceted surface morphology during a growth by molecular beam epitaxy
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:11 (2020),  26–30
5. Dislocation reactions in a semipolar gallium nitride layer grown on a vicinal Si(001) substrate using aluminum nitride and 3$C$–SiC buffer layers
   
   Fizika Tverdogo Tela, 61:12 (2019),  2317–2321
6. Microstructure of Si crystals subjected to irradiation with high-energy H$^+$ ions and heat treatment by high-resolution three-crystal X-ray diffraction and transmission electron microscopy
   
   Fizika Tverdogo Tela, 61:10 (2019),  1754–1762
7. On change in the silicon crystal structure implanted with hydrogen ions during annealing based on three-crystal X-ray diffractometry data
   
   Fizika Tverdogo Tela, 61:8 (2019),  1437–1442
8. Electrical and magnetic properties of Pb and In nanofilaments in asbestos near the superconducting transition
   
   Fizika Tverdogo Tela, 60:10 (2018),  1893–1899
9. Asymmetry of the defect structure of semipolar GaN grown on Si(001)
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:20 (2018),  53–61
10. Size effects in electrical and magnetic properties of quasi-one-dimensional tin wires in asbestos
    
    Fizika Tverdogo Tela, 58:3 (2016),  443–450
11. Development of a spinodal decomposition model for the example of a heterostructure based on silicon carbide polytypes
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:23 (2016),  66–71
12. Optical properties of metal nanoparticles in chrysotile channels
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:12 (2016),  96–102
13. Молекулярно-пучковая эпитаксия однодоменного арсенида галлия на (001) кремнии, пассивированном водородом
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 18:2 (1992),  1–5
14. Mechanism of microdefect formation during growing the dislocation-free silicon monocrystals
    
    Fizika Tverdogo Tela, 33:11 (1991),  3229–3234
15. Coesite nature of rodlike defects in Czochralski-grown and annealed silicon
    
    Fizika Tverdogo Tela, 32:12 (1990),  3659–3667
16. Kinetics of phosphorus solid solution decomposition in diffused $\mathrm{Si}$ layers
    
    Fizika Tverdogo Tela, 31:10 (1989),  182–188
17. Misfit stress relaxation in $\mathrm{In}_{1-x}\mathrm{Ga}_{x}\mathrm{As}_{1-y}\mathrm{Sb}_{y}/\mathrm{GaSb}(x\sim 0.1,y\sim 0.2)$ heterostructures
    
    Fizika Tverdogo Tela, 31:8 (1989),  158–163
18. Dislocation-nucleated low-temperature phase $D_{4h}$ in the surface layer of $\mathrm{SrTiO}_{3}$
    
    Fizika Tverdogo Tela, 30:7 (1988),  2066–2070
19. Stress fields and diffraction contrast of rod-like defects in silicon
    
    Fizika Tverdogo Tela, 30:7 (1988),  2040–2045
20. EFFECT OF NEUTRON-IRRADIATION ON STRUCTURAL DEFECTS IN CRUCIBLELESS SILICON
    
    Zhurnal Tekhnicheskoi Fiziki, 58:8 (1988),  1591–1593
21. X-RAY-DIFFRACTION ANALYSIS OF STRUCTURAL PERFECTION OF MONOCRYSTALS OF CADMIUM TELLURIDE
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:15 (1988),  1410–1413
22. Study of $D$-type microdefects in $\mathrm{Si}$
    
    Fizika Tverdogo Tela, 29:9 (1987),  2623–2628
23. An X-ray topographic study of $D$-defects in silicon
    
    Fizika Tverdogo Tela, 29:6 (1987),  1858–1861
24. MEASURING THE SCATTERING OF X-RAYS UNDER THE MIRROR REFLECTION IN THE DIFFERENTIAL REGIME
    
    Zhurnal Tekhnicheskoi Fiziki, 57:7 (1987),  1436–1438
25. Diffuse x-ray scattering from defects in germanium-lithium single crystals
    
    Fizika Tverdogo Tela, 28:12 (1986),  3734–3736
26. A study of the nature of microdefects in dislocation-free silicon single crystals
    
    Fizika Tverdogo Tela, 28:6 (1986),  1829–1833
27. Misfit $60^{\circ}$-degree-dislocations in $\mathrm{In}_{x}\mathrm{Ga}_{1-x}\mathrm{As}/\mathrm{GaAs} (001)$ type heterostructures
    
    Fizika Tverdogo Tela, 27:10 (1985),  2960–2964
28. Diffusion scattering on rod-like defects in oxygen-containing silicon crystals
    
    Fizika Tverdogo Tela, 27:3 (1985),  673–677
29. Experimental observation of dynamical effects at X-ray diffuse scattering
    
    Fizika Tverdogo Tela, 26:11 (1984),  3445–3447
30. Diffusion scattering distribution near Bragg reflections and its peculiarities at X-ray-diffraction by $\mathrm{Ge}$ single crystals doped with $\mathrm{As}$
    
    Fizika Tverdogo Tela, 26:7 (1984),  2155–2158
31. On diffraction shift of dislocation image at $g\times b\neq 0$ and $s\neq 0$
    
    Fizika Tverdogo Tela, 26:2 (1984),  466–470
32. New phase formation at decay of saturated lithium solid solution in germanium
    
    Fizika Tverdogo Tela, 26:2 (1984),  436–440
33. MEASUREMENT OF THE LOCAL THICKNESS OF CRYSTALS AND OBTAINING PROFILES OF DEFECT DISTRIBUTION ON DEGREES IN ION-ALLOYED SILICON LAYERS BY THE ELECTRON-MICROSCOPY METHOD
    
    Zhurnal Tekhnicheskoi Fiziki, 54:7 (1984),  1330–1333
34. Studies of the helical dislocation nature
    
    Fizika Tverdogo Tela, 25:11 (1983),  3313–3319
35. Effect of impurity environment of sessile Frank loop on its equilibrium configuration
    
    Fizika Tverdogo Tela, 25:7 (1983),  2051–2056